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Advanced Scanning Electron Microscopy and X-Ray Microanalysis

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Title: Advanced Scanning Electron Microscopy and X-Ray Microanalysis
by Dale E. Newbury, David C. Joy, Patrick Echlin, Charles E. Fiori, Joseph I. Goldstein
ISBN: 0-306-42140-2
Publisher: Plenum Pr
Pub. Date: March, 1986
Format: Hardcover
Volumes: 1
List Price(USD): $83.00

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	Title: Scanning Electron Microscopy and X-Ray Microanalysis by Joseph Goldstein, Dale Newbury, Patrick Kchlin, David C. Joy, Charles E. Lyman, Eric Lifshin, Linda Sawyer, Joseph R. Michael, Mark Staniforth ISBN: 0306472929 Publisher: Kluwer Academic Publishers Pub. Date: February, 2003 List Price(USD): $75.00

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