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Title: Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists by Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Ro ISBN: 0-306-44175-6 Publisher: Plenum Pub Corp Pub. Date: June, 1992 Format: Hardcover Volumes: 1 List Price(USD): $78.00

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Average Customer Rating: 5 (4 reviews)

Rating: 5
Summary: Excellent book for all types of audience
Comment: It was a privilege to learn the subjects of SEM and TEM from the the author of this book himself (David Joy). This is an excellent book which starts from the basics and it depends on the researcher how deep he wanna go. The book provides in depth analysis as well if required. Great resource book.

Rating: 5
Summary: Excellent text
Comment: Goldstein et al have written a book that serves as an excellent introduction to the SEM, and is also a formidable reference. When I took SEM at NC State University, it was taught from this book. Between our professor and this text, I learned the ins and outs of the SEM, and I keep the book within arms reach whenever I'm at work.

Goldstein covers everything from the basics of operation, through image formation, sample prep, usage in particular fields of study -- everything!

If you get one SEM book, get this one.

Rating: 5
Summary: A very good text book to own
Comment: This is an excellent textbook for graduate students majoring in Materials Science. The text is easy to read, and accompanied by plenty of photographs and schematics, is easy to understand. Covers almost every aspect of SEM and X-ray micro-analysis e.g. underlying science, technology, and practical use. Each chapter begins at a basic level and gradually develops the subject to intricate detail, and depending on the level of study one may skip chapters or part of a chapter.

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