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Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits: 21-25 July, 1997, Raffles City Convention Centre, Singapore

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Title: Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits: 21-25 July, 1997, Raffles City Convention Centre, Singapore
by International Symposium on the Physical, Failure Analysis of Integrat, Philip Ho, Chim Wai Kin, M. K. Radhakrishnan, Wai Kin Chim, IEEE Singapore Section Reliability, Cpmt, Eda Chapter, IEEE Electron Devices Society
ISBN: 0-7803-3985-1
Publisher: IEEE
Pub. Date: June, 1997
Format: Paperback
Volumes: 1
List Price(USD): $116.00

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