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Boundary-Scan Interconnect Diagnosis (Frontiers in Electronic Testing)

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Title: Boundary-Scan Interconnect Diagnosis (Frontiers in Electronic Testing)
by Jose T. De Sousa, Peter Y. K. Cheung, Jose T. De Sousa
ISBN: 0-7923-7314-6
Publisher: Kluwer Academic Publishers
Pub. Date: April, 2001
Format: Hardcover
Volumes: 1
List Price(USD): $157.00
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