AnyBook4Less.com - ISBN: 079239058X - Hierarchical Modeling for Vlsi Circuit Testing (Kluwer International Series in Engineering and Computer Science, 89) by Debashis Bhattacharya

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Hierarchical Modeling for Vlsi Circuit Testing (Kluwer International Series in Engineering and Computer Science, 89)

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Title: Hierarchical Modeling for Vlsi Circuit Testing (Kluwer International Series in Engineering and Computer Science, 89)
by Debashis Bhattacharya, John P. Hayes
ISBN: 0-7923-9058-X
Publisher: Kluwer Academic Publishers
Pub. Date: 01 February, 1990
Format: Hardcover
Volumes: 1
List Price(USD): $134.00

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