AnyBook4Less.com - ISBN: 0792393066 - Integrated Circuit Defect-Sensitivity: Theory and Computational Models (Kluwer International Series in Engineering and Computer Science, 208) by Jose Pineda De Gyvez

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Integrated Circuit Defect-Sensitivity: Theory and Computational Models (Kluwer International Series in Engineering and Computer Science, 208)

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Title: Integrated Circuit Defect-Sensitivity: Theory and Computational Models (Kluwer International Series in Engineering and Computer Science, 208)
by Jose Pineda De Gyvez
ISBN: 0-7923-9306-6
Publisher: Kluwer Academic Publishers
Pub. Date: January, 1993
Format: Hardcover
Volumes: 1
List Price(USD): $170.00

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