AnyBook4Less.com - ISBN: 0819434973 - Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes: Joint Proceedings of the Symposia on Altech 99, Satellite Symposiun to Essderc 99, Leuven, Belgium, the Electrochemical Society Symposium on diagnosti by Bernd O. Kolbesen

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Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes: Joint Proceedings of the Symposia on Altech 99, Satellite Symposiun to Essderc 99, Leuven, Belgium, the Electrochemical Society Symposium on diagnosti

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Title: Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes: Joint Proceedings of the Symposia on Altech 99, Satellite Symposiun to Essderc 99, Leuven, Belgium, the Electrochemical Society Symposium on diagnosti
by Bernd O. Kolbesen, Cor Claeys, Peter Stallhofer, Francois Tardif, Janet Benton, Thomas J. Shaffner, Dieter Schroder, Siego Kishino, P. Rai-Choudhury
ISBN: 0-8194-3497-3
Publisher: SPIE--The International Society for Optical Engineering
Pub. Date: September, 1999
Format: Hardcover
Volumes: 1
List Price(USD): $75.00

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