AnyBook4Less.com - ISBN: 0819439630 - Testing Reliability and Application: 24-26 January, 2001, San Jose, California USA (Proceedings of Spie--The International Society for Optical Engineering, V. 4285.) by Aland K. Chin

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Testing Reliability and Application: 24-26 January, 2001, San Jose, California USA (Proceedings of Spie--The International Society for Optical Engineering, V. 4285.)

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Title: Testing Reliability and Application: 24-26 January, 2001, San Jose, California USA (Proceedings of Spie--The International Society for Optical Engineering, V. 4285.)
by Aland K. Chin, Chin
ISBN: 0-8194-3963-0
Publisher: SPIE-International Society for Optical Engine
Pub. Date: 01 May, 2001
Format: Paperback
Volumes: 1
List Price(USD): $80.00

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