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Title: Test Resource Partitioning for System-on-a-Chip (FRONTIERS IN ELECTRONIC TESTING Volume 20) by Krishnendu Chakrabarty, Vikram Iyengar, Anshuman Chandra ISBN: 1-4020-7119-1 Publisher: Kluwer Academic Publishers Pub. Date: 01 May, 2002 Format: Hardcover Volumes: 1 List Price(USD): $115.00

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Average Customer Rating: 3 (1 review)

Rating: 3
Summary: Good book...but not essential
Comment: The book is one of a kind in SoC TRP approaches and contains lot of optmization procedures mostly using ILP and MILP..but the whole point if it is just a compendium of papers by the author. Students/ researchers who have access to the digital libraries of ieee/acm/kluwer have no need to purchase the book..I had all the papers and they were interesting and the authors are like the pioneers in the field but the book and the papers are one and the same..so save your money for a different book.