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High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing)

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Title: High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing)
by R. Dean Adams
ISBN: 1-4020-7255-4
Publisher: Kluwer Academic Publishers
Pub. Date: 01 September, 2002
Format: Hardcover
Volumes: 1
List Price(USD): $135.00
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Average Customer Rating: 5 (1 review)

Customer Reviews

Rating: 5
Summary: A rare treat
Comment: ____ In the world of semiconductor memory design, testing and diagnosis, information is scattered in papers, journals of various disciplines. Although text books are available, the coverage is often limited toacademic theories, models and algorithms. The more practical knowledge, unfortunately, have been mistakenly guarded as secret as a whole, although is often common knowledge for years among those in the field.
____ The lack of reference text has always made it difficult for those who are less-experienced to break into the field. Having worked on memory diagnosis as a graduate student, consultant, and independent consultant, I remember the frustration. I often heard others in the field echoing the same frustration.
____ Dean Adams has gathered those practical knowledges that in the past, can only be learned by years of experience into his book.

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