AnyBook4Less.com - ISBN: 1563967537 - Characterization and Metrology for Ulsi Technology : 1998 International Conference (AIP Conference Proceedings, Vol. 449) by David G. Seiler

AnyBook4Less.com

Find the Best Price on the Web
Order from a Major Online Bookstore

Home | Store List | FAQ | Contact Us |

Ultimate Book Price Comparison Engine
Save Your Time And Money

Characterization and Metrology for Ulsi Technology : 1998 International Conference (AIP Conference Proceedings, Vol. 449)

Please fill out form in order to compare prices

Title: Characterization and Metrology for Ulsi Technology : 1998 International Conference (AIP Conference Proceedings, Vol. 449)
by David G. Seiler, A.C. Diebold, W.M. Bullis, T.J. Shaffner, R. McDonald, E.J. Walters, International Conference on Characterization and Metrology for Ulsi Te
ISBN: 1-56396-753-7
Publisher: Springer Verlag
Pub. Date: December, 1998
Format: Hardcover
Volumes: 1
List Price(USD): $195.00

Your Country
Currency
Delivery
Include Used Books
Are you a club member of: Barnes and Noble Books A Million Chapters.Indigo.ca

Thank you for visiting www.AnyBook4Less.com and enjoy your savings!