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1. |  | Title: Beam Instrumentation Workshop: Stanford, Ca May 1998 (Aip Conference Proceedings, Vol 451) by Calif.)/ Seiler, D.G. Beam Instrumentation Workshop 1998 Stanford, Robert Hettel, Stephen R. Smith ISBN: 1563967944 Publisher: Springer Verlag Pub. Date: January, 1999 List Price: $155.00 Amazon.com Price: $155.00 |
| 2. |  | Title: Particles, Fields, and Gravitation: Lodz, Poland, April, 1998 (Aip Conference Proceedings, Vol 453) by J. Rembielinski, D.G. Seiler ISBN: 1563968371 Publisher: Springer Verlag Pub. Date: January, 1999 List Price: $145.00 Amazon.com Price: $145.00 |
| 3. |  | Title: Semiconductor Characterization: Present Status and Future Needs by W. Murray Bullis, D. G. Seiler, A. C. Diebold ISBN: 1563965038 Publisher: Springer Verlag Pub. Date: August, 1996 List Price: $98.00 Amazon.com Price: $98.00 |
| 4. |  | Title: Optical Characterization in Microelectronics Manufacturing by S. Perkowitz, D. G. Seiler ISBN: 0788115391 Publisher: DIANE Publishing Co Pub. Date: June, 1994 List Price: $25.00 Amazon.com Price: $25.00 |
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