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Cover ImageTitle: High Voltage Integrated Circuits (IEEE Press Selected Reprint Series)
by B. Jayant Baliga, Ieee Electron Devices Society, J. Baliga
ISBN: 0879422424
Publisher: IEEE
Pub. Date: December, 1988
List Price: $54.95
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Cover ImageTitle: 1998 Direct and Adverse Problems of Electromagnetic and Acoustic Wave Theory Conference (Diped
by IEEE Microwave Theory and Techniques, Electron Devices Societies, IEEE Microwave Theory & Techniques Socie, IEEE
ISBN: 9660206216
Publisher: IEEE
Pub. Date: November, 1998
List Price: $80.00
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Cover ImageTitle: Direct and Inverse Problems of Electromagnetic and Acoustic Wave Theory: Proceedings of Ivth International Seminar/Workshop: (Lviv, September 20-23, 1999)
by International Seminar, Workshop on Direct and Inverse Problems of Elect, IEEE Microwave Theory & Techniques Socie, IEEE Electron Devices Society
ISBN: 9660208642
Publisher: IEEE
Pub. Date: January, 2000
List Price: $112.00
Amazon.com Price: $112.00
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Cover ImageTitle: Microwave Conference "Microwave & Telecommunication Technology", 2001 11th International Crimean
by IEEE Electron Devices Society
ISBN: 9667968006
Publisher: IEEE
Pub. Date: September, 2001
List Price: $186.00
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Cover ImageTitle: 17th Nrsc'2000: Seventeenth National Radio Science Conference
by IEEE Electron Devices Society, IEEE, Ex&&&
ISBN: 9775031648
Publisher: IEEE
Pub. Date: August, 2000
List Price: $182.00
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Cover ImageTitle: Electrical Overstress/Electrostatic Discharge Symposium (Eos/Esd): 2000 22nd Annual Symposium
by IEEE Electron Devices Society
ISBN: 1585370185
Publisher: IEEE
Pub. Date: May, 2000
List Price: $162.00
Amazon.com Price: $162.00
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Cover ImageTitle: Modulation-Doped Field-Effect Transistors: Principles, Design and Technology
by Heinrich Daembkes, Ieee Electron Devices Society
ISBN: 0879422556
Publisher: IEEE
Pub. Date: December, 1991
List Price: $59.95
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Cover ImageTitle: 1999 4th International Symposium on Plasma Process-Induced Damage
by Thuy Dao, M. Koyanagi, Terence Hook, IEEE Electron Devices Society, IEEE, Th&&&&
ISBN: 0965157733
Publisher: IEEE
Pub. Date: November, 1999
List Price: $122.00
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Cover ImageTitle: Plasma & Process-Induced Damage, 2001: 6th International Symposium
by IEEE Electron Devices Society, Manfred Engelhardt
ISBN: 096515775X
Publisher: IEEE
Pub. Date: October, 2001
List Price: $140.00
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Cover ImageTitle: International Symposium on Plasma and Process-Induced Damage: 1996-2001 Proceedings
by IEEE Electron Devices Society, Manfred Engelhardt
ISBN: 0965157768
Publisher: IEEE
Pub. Date: October, 2001
List Price: $140.00
Amazon.com Price: $140.00
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