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Cover ImageTitle: Quality Conformance and Qualification of Microelectronic Packages and Interconnects
by Michael Pecht, Abhijit Dasgupta, John W. Evans, Jillian Y. Evans
ISBN: 0471594369
Publisher: Wiley-Interscience
Pub. Date: 07 November, 1994
List Price: $140.00
Amazon.com Price: $140.00
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Cover ImageTitle: Product Integrity and Reliability in Design
by John W. Evans, Jillian Y. Evans, John W. Evan
ISBN: 1852332158
Publisher: Springer-Verlag Telos
Pub. Date: 01 March, 2001
List Price: $179.00
Amazon.com Price: $179.00

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