| 1. 
  |  | Title: Secondary Ion Mass Spectrometry: SIMS IX by A. Benninghoven, Y. Nihei, R. Shimizu, H.W. Werner
 ISBN: 0471942189
 Publisher: John Wiley & Sons
 Pub. Date: 30 November, 1994
 List Price: $390.00
 Amazon.com Price: $390.00
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| 2. 
  |  | Title: Microbeam Analysis 2000 : Proceedings of the Second Conference of the International Union of Microbeam Analysis Societies Held in Kailu a-Koma, Hawaii by David B. Williams, R Shimizu, International Union Of Microbeam Analysi
 ISBN: 0750306858
 Publisher: Institute of Physics Publishing
 Pub. Date: October, 2000
 List Price: $210.00
 Amazon.com Price: $210.00
 | 
| 3. 
  |  | Title: Ferroelectric Thin Films XI by D. Kaufman, S. Hoffmann Eifert, S. R. Gilbert, S. Aggarwal, M. Shimizu
 ISBN: 1558996850
 Publisher: Material Research Society
 Pub. Date: August, 2003
 List Price: $106.00
 Amazon.com Price: $106.00
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| 4. 
  |  | Title: Secondary Ion Mass Spectrometry Sims IV: Proceedings of the Fourth International Conference, Osaka, Japan (Springer Series in Chemical Physics 36) by A. Benninghoven, J. Okano, R. Shimizu, H. W. Werner
 ISBN: 038713316X
 Publisher: Springer Verlag
 Pub. Date: May, 1984
 List Price: $49.50
 Amazon.com Price: $49.50
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