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1. |  | Title: Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing: Isle of Bendor, France, 10-12 July 2002 by Bernard Courtois, Thomas Wik, Yervant Zorian, IEEE Computer Society ISBN: 0769516173 Publisher: IEEE Pub. Date: September, 2002 List Price: $143.00 Amazon.com Price: $143.00 |
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