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Cover ImageTitle: Software Measurement: A Visualization Toolkit for Project Control and Process Improvement
by Dick B. Simmons, Newton C. Ellis, Hiroko Fujihara, Way Kuo
ISBN: 0138406952
Publisher: Prentice Hall
Pub. Date: 01 October, 1997
List Price: $60.00
Amazon.com Price: $60.00
2.
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Cover ImageTitle: Optimal Reliability Design: Fundamentals and Applications
by Way Kuo, V. Rajendra Prasad, Frank A. Tillman, Ching-Lai Hwang
ISBN: 0521781272
Publisher: Cambridge University Press
Pub. Date: 15 February, 2001
List Price: $70.00
Amazon.com Price: $70.00
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Cover ImageTitle: Optimal Reliability Modeling: Principles and Applications
by Way Kuo, Ming J. Zuo
ISBN: B0000952R2
Publisher: John Wiley & Sons, Inc.
List Price: $125.00
Amazon.com Price: $125.00
4.
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Cover ImageTitle: Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development
by Way Kuo, Wei-Ting Kary Chien, Taeho Kim
ISBN: 0792381076
Publisher: Kluwer Academic Publishers
Pub. Date: 01 December, 1997
List Price: $193.00
Amazon.com Price: $193.00
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Cover ImageTitle: Quality Through Engineering Design
by Way Kuo, Marcia Martens Pierson
ISBN: 0444896678
Publisher: Elsevier Publishing Company
Pub. Date: 01 December, 1992
List Price: $203.75
Amazon.com Price: $203.75
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Cover ImageTitle: Optimization of Systems Reliability
by Frank A. Tillman, Ching-Lai Hwang, Way Kuo
ISBN: 0824774469
Publisher: Marcel Dekker
Pub. Date: 01 June, 1980
List Price: $155.00
Amazon.com Price: $155.00

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