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1. |  | Title: Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics: Proceedings of Symposium Helt April 23-27, 2000, San Francisco, California U.S.A. by G. S. Oehrlein, K. Maex, Y.-C. Joo, S. Ogawa, J.T. Wetzel ISBN: 155899520X Publisher: Material Research Society Pub. Date: September, 2001 List Price: $82.00 Amazon.com Price: $82.00 |
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