1.
 |  | Title: International Conference on Modulation Spectroscopy: 19-21 March 1990, San Diego, California
by International Conference on Modulation Spectroscopy, Manuel Cardona, David E. Aspnes, Fred H. Pollak, D. E. Aspnes, Society of Photo-Optical Instrumentation Engineers, Society of Vacuum Coaters, Spie Symposium on ad
ISBN: 0819403377
Publisher: Society of Photo Optical
Pub. Date: 01 December, 1990
List Price: $70.00
Amazon.com Price: $70.00 |
2.
|  | Title: Spectroscopic Characterization Techniques for Semiconductor Technology (Proceedings of Spie-The International Society for Optical Engineering Vol 452)
by Fred H. Pollak, Robert S. Bauer
ISBN: 0892524871
Publisher: SPIE--The International Society for Optical Engineering
Pub. Date: February, 1984
List Price: $43.00
Amazon.com Price: $43.00 |
3.
|  | Title: Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices
by O.J. Glembocki, Fred H. Pollak, J.J. Song
ISBN: 089252829X
Publisher: Society of Photo Optical
Pub. Date: 01 June, 1987
List Price: $50.00
Amazon.com Price: $50.00 |
4.
|  | Title: Diagnostic Techniques for Semiconductor Materials Processing II: Symposium Held November 27-30, 1995, Boston, Massachusetts, U.S.A (Materials Research Society Symposia Proceedings, Vol 406)
by Stella W. Pang, Orest J. Glembocki, Fred H. Pollak, Francis G. Celii, Clivia M. Sotomayor Torres
ISBN: 1558993096
Publisher: Material Research Society
Pub. Date: February, 2000
List Price: $67.00
Amazon.com Price: $67.00 |
