1.
 |  | Title: Control of Semiconductor Surfaces and Interfaces: Symposium Held December 2-5, 1996, Boston, Massachusetts, U.S.A (Materials Research Society Symposia Proceedings, V. 448.)
by S. M. Prokes, O. J. Glembocki, S. K. Brierley, J. M. Gibson, J. M. Woodall
ISBN: 1558993525
Publisher: Material Research Society
Pub. Date: February, 2000
List Price: $62.00
Amazon.com Price: $62.00 |
2.
|  | Title: Diagnostic Techniques for Semiconductor Materials Processing: Symposium Held November 29-December 2, 1993, Boston, Massachusetts, U.S.A (Materials)
by O. J. Glembocki
ISBN: 1558992235
Publisher: Material Research Society
Pub. Date: March, 1998
List Price: $17.50
Amazon.com Price: $17.50 |
3.
|  | Title: Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices (Proceedings of Spie, the International Society for Optical)
by O.J. Glembocki, Fred H. Pollak, J.J. Song
ISBN: 089252829X
Publisher: SPIE--The International Society for Optical Engineering
Pub. Date: June, 1987
List Price: $50.00
Amazon.com Price: $50.00 |
