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1. |  | Title: In-Line Characterization, Yield Reliability, and Failure Analyses in Microelectronic Manufacturing: 19-21 May, 1999, Edinburgh, Scotland (Proceedings Europt Series) by Kostas Amberiadis, Gudrun Kissinger, Katsuya Okumura, Seshu Pabbisetty, Larg H. Weiland, European Optical Society, Society of Photo-Optical Instrumentation Engineers, Science, European Commission Directorate-General Xii ISBN: 0819432237 Publisher: SPIE--The International Society for Optical Engineering Pub. Date: April, 1999 List Price: $84.00 Amazon.com Price: $84.00 |
| 2. |  | Title: In-Line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing by Gudrun Kissinger, Larg H. Weiland ISBN: 0819441074 Publisher: SPIE--The International Society for Optical Engineering Pub. Date: April, 2001 List Price: $78.00 Amazon.com Price: $78.00 |
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