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Cover ImageTitle: Medical Diagnostic Techniques and Procedures
by M. Singh, S. Radhakrishnan, K. M. Patil
ISBN: 8173193509
Publisher: Narosa Pub House
Pub. Date: March, 2000
List Price: $156.00
Amazon.com Price: $156.00
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Cover ImageTitle: Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits
by John Thong, M. K. Radhakrishnan, IEEE Electron Devices Society, IEEE Reliability Society, IEEE Components Packaging & Manufacturin
ISBN: 0780351878
Publisher: IEEE
Pub. Date: December, 1999
List Price: $128.00
Amazon.com Price: $128.00
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Cover ImageTitle: Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits: 21-25 July, 1997, Raffles City Convention Centre, Singapore
by International Symposium on the Physical, Failure Analysis of Integrat, Philip Ho, Chim Wai Kin, M. K. Radhakrishnan, Wai Kin Chim, IEEE Singapore Section Reliability, Cpmt, Eda Chapter, IEEE Electron Devices Society
ISBN: 0780339851
Publisher: IEEE
Pub. Date: June, 1997
List Price: $116.00
Amazon.com Price: $116.00
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Cover ImageTitle: FST TCS 2003: Foundations of Software Technology and Theoretical Computer Science
by Paritosh K. Pandya, M. Agrawal, Jaikumar Radhakrishnan, Paritosh K Pandya
ISBN: 3540206809
Publisher: Springer Verlag
Pub. Date: 12 February, 2004
List Price: $75.00
Amazon.com Price: $75.00

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