| 1. 
  |  | Title: Nist Janaf Thermochemical Tables (Journal of Physical and Chemical Reference Data. Monograph, No. 9) by M. W. Chase, National Institute of Standards and Technology (U.S.)
 ISBN: 1563968312
 Publisher: Amer Inst of Physics
 Pub. Date: October, 1998
 List Price: $195.00
 Amazon.com Price: $195.00
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| 2. 
  |  | Title: Micromachining and Microfabrication Process Technology: 23-24 October, 1995, Austin, Texas (Proceedings of Spie--The International Society of Optical Engineering, V. 2639.) by Karen W. Markus, Semiconductor Equipment and Materials International, National Institute of Standards and Technology (U.S.), Society of Photo-Optical Instrumentation Engineers
 ISBN: 0819420050
 Publisher: SPIE--The International Society for Optical Engineering
 Pub. Date: September, 1995
 List Price: $66.00
 Amazon.com Price: $66.00
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| 3. 
  |  | Title: Polynuclear Aromatic Hydrocarbons: Measurements, Means, and Metabolism by International Symposium on Polynuclear Aromatic Hydrocarbons 1987  Gai, Kurt Loening, Joy Merritt, Marcus Cooke, National Cancer Institute (U.S.), National Institute of Standards and Technology (U.S.)
 ISBN: 0935470581
 Publisher: Battelle Pr
 Pub. Date: August, 1990
 List Price: $82.50
 Amazon.com Price: $82.50
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| 4. 
  |  | Title: Microelectronic Structures and Microelectromechanical Devices: 24 October, 1995, Austin, Texas (Proceedings of Spie--The International Society for Optical Engineering, V. 2641.) by Wayne E. Bailey, M. Edward Motamedi, Fang-Chen Luo, Semiconductor Equipment and Materials International, National Institute of Standards and Technology (U.S.), Society of Photo-Optical Instrumentation Engineers
 ISBN: 0819420077
 Publisher: SPIE--The International Society for Optical Engineering
 Pub. Date: September, 1995
 List Price: $46.00
 Amazon.com Price: $46.00
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| 5. 
  |  | Title: Machine Vision Applications, Architectures and Systems Integration VI: 15-16 October 1997, Pittsburgh, Pennsylvania (Spie Proceedings, Vol 3205) by Bruce G. Batchelor, Susan Soloman, Susan Snell Solomon, John W. V. Miller, Society of Photo-Optical Instrumentation Engineers, Machine Vision Association of Sme, National Institute of Standards and Technology
 ISBN: 0819426377
 Publisher: SPIE--The International Society for Optical Engineering
 Pub. Date: September, 1997
 List Price: $69.00
 Amazon.com Price: $69.00
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| 6. 
  |  | Title: Micromachined Devices and Components 23 24 October 1995: 23-24 October, 1995, Austin, Texas (Proceedings of Spie--The International Society for Optical Engineering, V. 2642.) by Ray Roop, Kevin Chau, Semiconductor Equipment and Materials International, Society of Photo-Optical Instrumentation Engineers, National Institute of Standards and Technology (U.S.), Society of Photo-Optical Instrumentation
 ISBN: 0819420085
 Publisher: SPIE--The International Society for Optical Engineering
 Pub. Date: September, 1995
 List Price: $66.00
 Amazon.com Price: $66.00
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| 7. 
  |  | Title: Microlithography and Metrology in Micromachining 23 24 October 1995 : 23-24 October, 1995, Austin, Texas by Michael T. Postek, Semiconductor Equipment and Materials Institute, National Institute of Standards and Technology (U.S.), Society of Photo-Optical Instrumentation Engineers
 ISBN: 0819420069
 Publisher: SPIE--The International Society for Optical Engineering
 Pub. Date: September, 1995
 List Price: $66.00
 Amazon.com Price: $66.00
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| 8. 
  |  | Title: Metrology and Properties of Engineering Surfaces: Proceedings of the Fourth International Conference, Washington DC, April 1988 by Edited by K J Stout University of Birmingham UK and Editor of the journal Surface Topography and T V Vorburger Centre for Manufacturing Engineering National Institute of Standards and Technology USA
 ISBN: 1850919380
 Publisher: Kluwer Academic Publishers Group
 Pub. Date: 31 May, 1989
 
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