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Cover ImageTitle: Characterization and Metrology for Ulsi Technology 2003: International Conference on Characterization and Metrology for Ulsi Technology, Austin, Texas 24-28 March 2003
by David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, Robert McDonald, Stefan Zollner, Rajinder P. Khosla, Eric M. Secula
ISBN: 0735401527
Publisher: AIP Press
Pub. Date: 01 November, 2003
List Price: $210.00
Amazon.com Price: $210.00
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Cover ImageTitle: Silicon-Germanium Carbon Alloys: Growth, Properties and Applications (Optoelectronic Properities of Semiconductors and Superlattices)
by Sokrates T. Pantelides, Stefan Zollner
ISBN: 1560329637
Publisher: Taylor & Francis Group
Pub. Date: June, 2002
List Price: $153.00
Amazon.com Price: $153.00
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Cover ImageTitle: Orgelmusik Im Nationalsozialistischen Deutschland
by Stefan Zollner
ISBN: 3631342365
Publisher: Peter Lang Publishing
Pub. Date: December, 1999
List Price: $51.95
Amazon.com Price: $51.95

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