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1. |  | Title: Characterization and Metrology for Ulsi Technology 2003: International Conference on Characterization and Metrology for Ulsi Technology, Austin, Texas 24-28 March 2003 by David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, Robert McDonald, Stefan Zollner, Rajinder P. Khosla, Eric M. Secula ISBN: 0735401527 Publisher: AIP Press Pub. Date: 01 November, 2003 List Price: $210.00 Amazon.com Price: $210.00 |
| 2. |  | Title: Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes: Joint Proceedings of the Symposia on Altech 99, Satellite Symposiun to Essderc 99, Leuven, Belgium, the Electrochemical Society Symposium on diagnosti by Bernd O. Kolbesen, Cor Claeys, Peter Stallhofer, Francois Tardif, Janet Benton, Thomas J. Shaffner, Dieter Schroder, Siego Kishino, P. Rai-Choudhury ISBN: 0819434973 Publisher: Electrochemical Society, Incorporated Pub. Date: 01 September, 1999 List Price: $75.00 Amazon.com Price: $75.00 |
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