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1. |  | Title: Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes: Joint Proceedings of the Symposia on Altech 99, Satellite Sy ... osium on diagnosti (Spie Proceedings Series,) by Bernd O. Kolbesen, Cor Claeys, Peter Stallhofer, Francois Tardif, Janet Benton, Thomas J. Shaffner, Dieter Schroder, Siego Kishino, P. Rai-Choudhury ISBN: 0819434973 Publisher: Electrochemical Society, Incorporated Pub. Date: 01 September, 1999 List Price: $75.00 Amazon.com Price: $75.00 |
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